The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 2002
Filed:
Jun. 23, 1999
George E. Yefchak, Santa Clara, CA (US);
Agilent Technologies, Inc., Palo Alto, CA (US);
Abstract
A time-of-flight mass spectrometer includes a deflector and a filter assembly that is located along a flight path between the deflector and an ion detector. The filter assembly passes incoming ions to the detector when the ions approach the filter assembly along their original flight path, and the filter assembly occludes incoming ions from the detector when the ions have been deflected from their original flight path by the deflector. In an embodiment, the filter assembly includes filtering plates that are aligned such that the major surfaces of the filtering plates are parallel to the original flight path of the ions. In order to remove ions of a particular mass from a mass spectrum of ions, target ions are deflected from their original flight path, causing the target ions to impact the filtering plates while the ions that are not deflected from their original flight path pass between the filtering plates for measurement by the detector.