The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 09, 2002

Filed:

Feb. 16, 2001
Applicant:
Inventors:

Markus Hauf, Ichenhausen, DE;

Thomas Knarr, Langenau, DE;

Heinrich Walk, Allmendingen, DE;

Horst Balthasar, Neu-Ulm, DE;

Uwe Müller, Eibensbach, DE;

Assignee:

Steag Ast, , DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
F27D 1/100 ;
U.S. Cl.
CPC ...
F27D 1/100 ;
Abstract

A method is provide for measuring electromagnetic radiation radiated from a surface of an object that is irradiated by electromagnetic radiation given off by at least one radiation source. The radiation given off by the radiation source is determined by at least one first detector, and the radiation given off by the irradiated object is determined by at least one second detector that measures the radiation. The radiation from the at least one radiation source is actively modulated with at least one characteristic pyrometer. The radiation determined by the second detector is corrected with the radiation determined by the first detector to compensate for the radiation of the radiation source reflected from the object.


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