The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 09, 2002

Filed:

May. 27, 1999
Applicant:
Inventors:

Werner Baumann, Freiburg, DE;

Ralf Ehret, Merdingen, DE;

Mirko Lehmann, Freiburg, DE;

Günter Igel, Teningen, DE;

Hans-Jürgen Gahle, Emmendingen, DE;

Bernhard Wolf, Stegen, DE;

Ulrich Sieben, Reute, DE;

Ingo Freund, Vogtsburg-Oberrotweil, DE;

Martin Brischwein, Freiburg, DE;

Assignee:

Micronas GmbH, Freiburg, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12M 1/42 ;
U.S. Cl.
CPC ...
C12M 1/42 ;
Abstract

A method is provided for measuring a state variable of a biological cell ( ) located in a nutrient medium ( ) and supported on and adhering to a support area ( ). Within the support area ( ) for the cell ( ) and at a distance from the support area edge, an opening is made in the membrane of the cell ( ). The edge of the cell membrane that surrounds the opening and adheres to the support area ( ) seals off the liquid found inside the cell ( ) from the nutrient medium ( ). Through the opening the state variable ( ) is measured. An apparatus for performing the method is also provided.


Find Patent Forward Citations

Baumann, Werner. (2002). Method and apparatus for measuring a state variable (U.S. Patent No. 6368851). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6368851

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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