The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 2002
Filed:
Apr. 05, 2000
Zuhua Mao, Issaquah, WA (US);
Peng Jiang, Issaquah, WA (US);
Patrick L. Von Behren, Bellevue, WA (US);
David E. Gustafson, North Bend, WA (US);
Siemens Medical Solutions USA, Inc., Iselin, NJ (US);
Abstract
A method of dynamically measuring parameters within a series of images using image processing is disclosed. A sequence of ultrasound images is generated by means of an ultrasound system. A user determines at least one region of interest within a first image. Then, at least one parameter for each region of interest is evaluated, e.g. the number of pixels exceeding a pre-defined intensity are counted. A new region of interest within a sequential image is searched within a search area around the predefined region of interest which best matches the region of interest. This is done for all images of a sequence whereby the new region of interest which best matches the region of interest of the previous image is used as a region of interest for the following image.