The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 09, 2002

Filed:

Apr. 07, 2000
Applicant:
Inventors:

Akihiro Osaka, Tokyo, JP;

Hiroshi Sekiyama, Tokyo, JP;

Kouichi Noto, Tokyo, JP;

Masaki Sugawara, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B44C 1/12 ; A51H 2/400 ;
U.S. Cl.
CPC ...
B44C 1/12 ; A51H 2/400 ;
Abstract

Particles are prevented from clinging to the back of a water in the notch alignment of the wafer, and the problems encountered when a plurality of wafers were aligned all at once are solved. Three support poles are erected on a turntable . The substrate outer periphery of wafers is supported by the tapered portions of support pins protruding from the support poles . The turntable is driven by a single motor , and all of the wafers are rotated at once. During rotation, the notches of al the wafers are detected by an optical sensor provided to a sensor pole , and the angular position thereof is stored. The wafers are rotated an the basis of the angular position data, and notch alignment is performed successively, starting with the bottom wafer . The wafers that have undergone notch alignment are successively picked up by the pick-up support pins of pick-up poles , and are retracted from the support poles that are rotating for notch alignment. Once all of the alignments have been completed, the retracted wafers are returned to the support pins


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