The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 2002
Filed:
Jun. 07, 1999
Arnold O. Danielson, Inyokern, CA (US);
The United States of America as represented by the Secretary of the Navy, Washington, DC (US);
Abstract
Provided in a compact system is a rapid response h-q-T sensor assembly, with associated processor and holding device, for measuring temperature, T, and heat flux, q, in a severe operating environment. From measured temperatures, T, and heat flux, q, a stagnation point recovery temperature, T , and a heat transfer coefficient, h, may be calculated using approximation algorithms loaded in the processor. The system approximates the ideal conditions in which T is derived from measuring a high temperature, i.e., a zero heat flux path to ground, i.e., q=0, r=∞ and a lower wall temperature measured along an infinite heat flux path, i.e, q=∞, r=0. Although ideal conditions are not able to be duplicated, appropriate positioning of heat flux indicators and temperature indicators in the surface of a thin film on the q-h-T sensor assembly, while allowing for very short duration sampling in a hostile environment, permits a viable approximation. Using a pair of algorithms, the measured values of temperature, T, and heat flux, q, and calibrating a value of thermal resistance, data are processed in situ to yield derived values for the worst case heat transfer coefficient, h, and the stagnation recovery temperature, T .