The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 02, 2002
Filed:
Mar. 20, 1998
Tatsunori Komoike, Tokyo, JP;
Mitsubishi Denki Kabushiki Kaisha, Tokyo, JP;
Abstract
In a semiconductor integrated circuit device, a pattern generator generates burn-in test patterns based on control signals received through external terminals and corresponding I/O buffers, and provides the generated burn-in test patterns to input terminals of a DRAM . The burn-in test operation is performed only by using the control signals received through the external terminals and the corresponding I/O buffers. The burn-in test operation is performed by a small number of access operations to the I/O buffers because the number of the access operations to the I/O buffers may be decreased when comparing with a conventional one. Thereby, the accuracy of the reliability test for the DRAM may be increased.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile