The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 02, 2002

Filed:

Dec. 17, 1998
Applicant:
Inventor:

Larry J. Yount, Scottsdale, AZ (US);

Assignee:

Honeywell International Inc., Morristown, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H02H 3/05 ;
U.S. Cl.
CPC ...
H02H 3/05 ;
Abstract

The present invention, Layered Detection Architecture (“LDA”) is useful to enhance the detection of command control processing errors and also facilitate survivorship among properly functioning flight critical Core Processing Modules (“CPM”) while eliminating faulty CPM responsible for processing execution errors. LDA is contemplated for use with lock-step execution verification schemes and other result comparison command-processing error detection methods also implementing redundant independent processing units.


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Yount, Larry. (2002). Critical control adaption of integrated modular architecture (U.S. Patent No. 6367031). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6367031

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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