The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 02, 2002

Filed:

May. 08, 2000
Applicant:
Inventors:

Philippe Rabiller, Lescar, FR;

Frédéric Robail, Dainville, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 5/04 ;
U.S. Cl.
CPC ...
G01V 5/04 ;
Abstract

Method of detecting breaks in logging signals consisting of logs of different kinds recorded as a function of depth, of the type consisting in selecting a portion from each of the said logs in such a way that all the selected portions have a same depth interval in common, one of the selected portions being regarded as reference portion; selecting a parent wavelet function and constructing, from the said parent function, a family of wavelet analysis functions dependent on spatial frequency and on depth, the said method being characterized in that it furthermore consists in calculating, for each portion of log selected and for each depth datum, the absolute value of the mean gradient of the characteristic quantity of the wavelet transform for the various spatial analysis frequencies; selecting, for each portion of log processed, the peaks of the absolute value of the mean gradient of the characteristic quantity.


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