The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 02, 2002
Filed:
Aug. 04, 1998
William D. Heavlin, El Granada, CA (US);
Advanced Micro Devices, Inc., Sunnyvale, CA (US);
Abstract
A method of defining a toleranced process based on a nominal process, applicable to any manufacturing process wherein the output is dependent on a process having a number of input factors which are subject to variation, and have a mean and standard deviation. The method comprises the steps of: representing the variability of the response of a system to the current variability of at least one of the factors and at least one tightening factor; evaluating the components against a schedule of tightening factors in an array; modeling the output of the evaluation using interpolation to determine a mathematical function defining the toleranced process; and applying at least one of the models to a fabrication system to complete the toleranced process.