The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 02, 2002
Filed:
Apr. 13, 1999
Richard Lynn Gardner, Jr., Greeley, CO (US);
Robert W. Luffel, Greeley, CO (US);
Richard A. Irwin, Fort Collins, CO (US);
Hewlett-Packard Company, Palo Alto, CA (US);
Abstract
An alignment system for an imaging apparatus is disclosed. The alignment system aligns the image beam associated with the imaging apparatus relative to predetermined reference points, such as the vertex and base of a right triangle. The base of the right triangle may be normal to the image beam and the vertex of the right triangle may be located at a fixed and predetermined location relative to the imaging apparatus. The image beam may intersect a hypotenuse point on the hypotenuse of the right triangle and the image beam may intersect a base point on the base of the right triangle. The alignment system measures the distance between the base point and the hypotenuse point. The distance between the base point and the hypotenuse point corresponds to a single location on the base relative to the vertex. The alignment systems, thus, references the transverse position of the image beam relative to the vertex. The alignment system also references the vertical position of the image beam relative to the location on the image beam where the image beam intersects the base.