The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 02, 2002
Filed:
Jul. 23, 2001
Johann Rieger, Zell, DE;
Thomas Von Der Ropp, Germering, DE;
Infineon Technologies, Munich, DE;
Abstract
A method for checking a semiconductor memory device integrated on a semiconductor chip includes providing the semiconductor memory device with a plurality of memory cells each being disposed on a semiconductor substrate for one binary information value, data lines for reading out and writing in information values, gate transistors being associated with the memory cells for selectively clearing a data path between a given memory cell and a data line, selection lines for purposefully triggering the gate transistors, and at least one in-chip reference voltage being adjusted to a predetermined normal value when the semiconductor memory device is functioning as intended. The method for checking the semiconductor memory device integrated on a semiconductor chip is carried out by at least intermittently varying the at least one in-chip reference voltage, and detecting and weighting the information values read out at the at least intermittently varied reference voltage.