The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 02, 2002
Filed:
Feb. 16, 2000
Rolf Roeder, Jena, DE;
Carl Zeiss Jena GmbH, Jena, DE;
Abstract
In relay optics for a deflection system with two scanning devices, each of which changes the angle of a light bundle from a location predetermined separately for each scanning device in a predetermined deflection plane within a predetermined deflection area, an optical system and a mirror surface are provided, wherein the optical axis coincides with respect to position and direction with the central normal of the connecting straight line between the predetermined locations of the first scanning device and second scanning device and the shape and position of the mirror surface are realized in accordance with the conditions that the two vectors, the direction vector of the light bundle and the surface normal of the mirror surface, each projected in the deflection plane of the first scanning device, are identical with respect to direction for every point of incidence of the light bundle on the mirror surface given by the deflection of the first scanning device and that the path of the light bundle running toward the focal surface of the optical system, with the optical axis of the optical system as axis of symmetry, is mirror-symmetric to the path of the light bundle running back from the focal surface.