The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 02, 2002
Filed:
Jul. 14, 1999
Applicant:
Inventor:
Martin Buck, München, DE;
Assignee:
Siemens Aktiengesellschaft, Munich, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/126 ;
U.S. Cl.
CPC ...
G01R 3/126 ;
Abstract
A configuration is provided for testing chips produced from a wafer. The chips are supplied with test signals through the use of a test head. The test signals can be applied in a serial or parallel manner to the chips which are actually in the wafer, through the use of test lines provided in a sawing edge of the chips.
Quick Actions:
Buck, Martin. (2002). Configuration for testing chips (U.S. Patent No. 6366110). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6366110
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