The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 02, 2002

Filed:

Nov. 24, 1999
Applicant:
Inventors:

Tetsuhiko Takahashi, Soka, JP;

Hiromichi Shimizu, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/00 ;
U.S. Cl.
CPC ...
G01V 3/00 ;
Abstract

A plurality of signal acquisition steps to are executed continuously in succession to an inversion longitudinal magnetization generation step for generating inversion magnetization by applying inversion RF pulses to an object. Similar process steps are iterated in another inversion longitudinal magnetization step in a slice non-selecting mode, and the difference is determined between image data acquired by the first signal acquisition steps to and image data acquired by the second signal acquisition steps to to acquire a perfusion image. In this instance, the mode of applying the gradient magnetic field is made different in each signal acquisition step, and images of a plurality of slices are acquired. The process steps described above are iterated while the correspondence relation between an inversion time TI and a selected slice is changed. An image having different inversion times can thus be acquired within a short time for a plurality of slices. Consequently, an image reflecting the time change of perfusion and having a high diagnostic value can be acquired over a broad range.


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