The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 02, 2002

Filed:

Nov. 23, 1999
Applicant:
Inventor:

Christian A. Le Cocq, Menlo Park, CA (US);

Assignee:

Agilent Technologies, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 4/940 ; H01J 4/900 ; H01J 4/400 ;
U.S. Cl.
CPC ...
H01J 4/940 ; H01J 4/900 ; H01J 4/400 ;
Abstract

A technique for analyzing ions by determining the time of flight of the ions in a time of flight mass spectrometer using internal calibration. In the technique, a calibration step includes the steps of launching a packet of ions from a source to a detector, detecting the time needed for the ions to arrive at the detector to obtain a time-of-flight mass spectrum, and selecting data from the mass spectrum corresponding to a plurality of ions of consecutive masses and use the selected data to determine the relationship between time of flight data and the masses of the ions of consecutive masses for calibration of the relation between times of flight and masses in the mass spectrometer.


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