The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 2002

Filed:

May. 06, 1999
Applicant:
Inventor:

Li-Wen Chen, Cupertino, CA (US);

Assignee:

MetaEdge Corporation, Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/760 ;
U.S. Cl.
CPC ...
G06F 1/760 ;
Abstract

According to the invention, techniques for organizing information from systems in a data warehousing environment are provided. In a particular embodiment, the invention provides a system for analyzing data in at least data source of an enterprise. The system includes a variety of steps, such as a step of providing a meta model for an enterprise. The enterprise is typically a business activity, but can also be other loci of human activity. A step of forming a data schema from the meta model is also part of the system. The system also includes creating a database organized to the data schema. Translating data from a variety of sources to the data schema is also part of the system. A step of incorporating data into the database is part of the system. The system can also include a step of performing analysis on the data in the database. The combination of these steps can organize information in a data warehousing environment.


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