The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 2002

Filed:

May. 02, 2000
Applicant:
Inventors:

Bradley C. Wallet, San Francisco, CA (US);

Robert Wentland, Boulder, CO (US);

Peter Whitehead, San Rafael, CA (US);

Assignee:

Chroma Graphics, Inc., Burlingame, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/18 ;
U.S. Cl.
CPC ...
G01V 3/18 ;
Abstract

Given a spatial dataset of n dimensions, a data-driven partitioning of the dataset is effected into topographically contiguous regions using feature specific indices (for example, by examining the change in polarity of the impedance of seismic data). Then on each region, a set of features (which may be mathematical functions) is calculated (e.g., mean value of all data in the region), wherein the features are considered sufficiently descriptive of the region. Thereupon, two or more regions which are topographically contiguous are grouped together and the associated features are assembled in a structure (e.g., a vector or a matrix) to be input to a classifier.


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