The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 2002

Filed:

Feb. 24, 1999
Applicant:
Inventor:

Steffen Schulze, Wappingers Falls, NY (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 7/66 ;
U.S. Cl.
CPC ...
G06F 7/66 ;
Abstract

A method for inspecting photomasks, in accordance with present invention includes the step of providing a design data set for fabricating a photomask, searching the design data set for sub-groundrule features, eliminating the sub-groundrule features from the data set to form an inspection data set and inspecting a photomask fabricated in accordance with the design data set by employing the inspection data set. A system for executing the steps in accordance with the present invention is also provided.


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