The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 26, 2002
Filed:
Dec. 17, 1999
D. Alan Hanna, Boulder, CO (US);
Mark A. Norris, Boulder, CO (US);
Datex-Ohmeda, Inc., Madison, WI (US);
Abstract
An improved method and apparatus is disclosed for use in frequency division multiplexed spectrophotometric systems. In photoplethysmographic applications the invention provides for the modulation of a plurality of light sources at different frequencies and in accordance with a predetermined phase relationship. Light from the sources that is transmitted through a tissue under test is detected at a detector. A composite signal indicative of the intensity of light received at the detector is demodulated based on the different modulation frequencies and predetermined phase relationship to obtain signal portions corresponding with each of the light sources. Modulation and demodulation are synchronized during each measurement period. The modulation waveforms used to modulate the light sources and corresponding demodulation waveforms used to demultiplex the composite signal are symmetrically timed about a center point for each of the measurement periods. The invention reduces artifacts associated with rising/falling light source amplitude levels, thereby reducing system noise sensitivity.