The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 26, 2002
Filed:
Oct. 29, 1999
Gary Wang, Santa Rosa, CA (US);
Paul S. Bussard, Santa Rosa, CA (US);
Zoltan D. Azary, Occidental, CA (US);
Kenneth R. Wildnauer, Santa Rosa, CA (US);
Peter Egerton, Santa Rosa, CA (US);
Agilent Technologies, Inc., Palo Alto, CA (US);
Abstract
Improved calibration of optical wavelength measuring instruments. In a first embodiment, improved calibration is achieved in an optical wavelength measuring instrument by performing calibration measurements at a plurality of known wavelengths and using an average calibration constant derived from the plurality of measurements. In a second embodiment, improved calibration is achieved by performing calibration measurements at a plurality of known wavelengths and calculating a linear or higher order calibration model, or a periodic model. These approaches may be extended by segmenting the wavelength range and using different calculated calibration values, or different calibration models, for each segment.