The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 26, 2002
Filed:
Feb. 05, 2000
Michael T. Parker, Camarillo, CA (US);
Howard M. Ham, Jr., late of Fresno, CA (US);
James J. Keenan, Santa Barbara, CA (US);
Luc Pierre Benoit, La Cañada Flintridge, CA (US);
Hendry Mechanical Works, Goleta, CA (US);
Abstract
Electric arc monitoring is effected by exploiting the discovery that electric arcs are fractal phenomena in that all essential information that signifies an “arc” is contained in each fractal subset. The fractal subsets are logarithmically distributed over the arc spectrum. Monitoring of arcs is most advantageously effected on a fractal subset of low logarithmic order where the amplitude is higher pursuant to the 1/f characteristic of electric arcs, where cross-induction among neighboring circuits is lower, and where travel between the arc and the arc signature pickup is longer that at the high frequency customary for electric arc detection. Fractal subset information reduces the danger of false alarms. Arc signature portions may be processed in out of phase paths or treated as modulated carriers for monitoring.