The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 26, 2002
Filed:
Jul. 14, 2000
Commonwealth Scientific and Industrial Research Organisation, Campbell, AU;
Abstract
The present invention related generally to bulk material analyzers suitable for the direct on-line analysis of materials such as coal and minerals. It is targeted particularly at direct on-conveyor belt analysis. It includes: a shielded enclosure defining an analysis zone within it and having a passageway through it to allow transport of bulk material through the analysis zone. At least one neutron source ( ) and at least two gamma ray detectors ( ) are disposed within the enclosure to measure gamma-rays produced in the bulk material by both the neutron inelastic scatter and thermal neutron capture processes. A neutron source and a gamma-ray detector are arranged in either a transmission or backscatter geometry. A second gamma-ray detector is arranged either in a transmission or backscatter geometry with or without using a second neutron source. The arrangement of detectors is such that the bias in the spatial response of each, that is caused by the relative attenuation of neutrons and gamma-rays in the bulk material, at least partly compensates for bias in the spatial response of the other.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile