The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 26, 2002
Filed:
Sep. 21, 1999
Applicant:
Inventor:
Thomas Francis Strelchun, Mertztown, PA (US);
Assignee:
Agere Systems Guardian Corp., Orlando, FL (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/02 ;
U.S. Cl.
CPC ...
G01J 3/02 ;
Abstract
A measurement tool for assessing the wavelength linearity of an optical spectrum analyzer utilizes the linear skirt slope region of the included resolution bandwidth filter. The input wavelength is swept from a predetermined start value to a predetermined stop value, and the associated amplitude is recorded. The insertion loss associated with the system is first determined so that this loss can be removed from the recorded amplitude values. By knowing the skirt slope and the measured amplitudes, the wavelength offset can be determined.