The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 26, 2002
Filed:
Sep. 29, 2000
Applicant:
Inventor:
Masanao Fujieda, Toyohashi, JP;
Assignee:
Nidek Co., Ltd., Aichi, JP;
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/14 ;
U.S. Cl.
CPC ...
A61B 3/14 ;
Abstract
An ophthalmic apparatus for measuring a characteristic of an eye to be examined, the apparatus comprising a moving device for relatively moving a measurement unit with respect to the eye, wherein the measurement unit includes a measurement system for measuring the characteristic of the eye, a position detecting device for detecting a relative position of the measurement unit with respect to the eye at the time of measurement, a storing device for storing detected position data, and a processing device for performing a predetermined processing based on a plurality of position data stored in each measurement.