The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 2002

Filed:

Nov. 24, 1999
Applicant:
Inventors:

Xuhua Yang, Chiryu, JP;

Hisashi Shigekusa, Okazaki, JP;

Assignee:

Denso Corporation, Kariya, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 7/10 ;
U.S. Cl.
CPC ...
G06K 7/10 ;
Abstract

A method of reading information out of a two-dimensional code made up of a matrix of cells having a given optical pattern is provided. The two-dimensional code has location symbols used to locate the two-dimensional code and alignment symbols used to locate the cells. The method first calculates a central position of each of the alignment symbols in an image of the two-dimensional code using a predetermined positional relation to the location symbols and selects one of reference patterns which matches up with an optical pattern formed with a pixel lying at the calculated central position of the alignment symbol and surrounding pixels. The method specifies an actual central position of each of the alignment symbols in the image of the two-dimensional code using the matched reference pattern. This compensates for a locational error between the calculated central position and the actual central position of each of the alignment symbols due to deformation of the image taking place, for example, when the two-dimensional code is printed on a round object.


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