The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 2002

Filed:

Jun. 25, 1999
Applicant:
Inventors:

John Eldred, Holland, MI (US);

Christopher Scholten, Holland, MI (US);

Vincent Jasinski, Grand Rapids, MI (US);

Randall Beekman, Dorr, MI (US);

Clinton Peterson, Holland, MI (US);

Kevin Ewing, Holland, MI (US);

Roger Lubbers, Holland, MI (US);

Assignee:

Venturedyne, Ltd., Milwaukee, WI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 2/904 ;
U.S. Cl.
CPC ...
G01N 2/904 ;
Abstract

An apparatus is provided for conducting environmental tests on a device. The apparatus includes a cabinet defining a testing chamber for receiving the device therein. Control structure, operatively connected to the cabinet, varies the environmental conditions within the testing chamber to a user desired environment. An isolation structure is provided for isolating the device within the testing chamber and preventing electromagnetic and radio frequency waves from passing therethrough.


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