The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 19, 2002

Filed:

Jan. 27, 1999
Applicant:
Inventors:

Robert C. Zak, Bolton, MA (US);

Hien H. Nguyen, Auburndale, MA (US);

Monica C. Wong-Chan, Concord, MA (US);

Assignee:

Sun Microsystems, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/100 ; G06F 1/130 ;
U.S. Cl.
CPC ...
G06F 1/100 ; G06F 1/130 ;
Abstract

A performance counter to monitor a plurality of events that may occur in a component within a computer system during a monitoring period or testing period. The monitoring results, which are provided upon completion of the performance testing, may be used to provide histogram representations of the component performance. In one embodiment, the performance counter comprises a first storage, a second storage, programmable control logic, and a counting mechanism. The first storage is configured to store information indicative of a plurality of events to be monitored and the monitoring period for each event. The second storage is configured to store counting results obtained during the testing period. A counting mechanism, which is coupled to the second storage, is configured to monitor the occurrence of the events in the component under test. The counting mechanism is coupled to the control logic and the control logic is coupled to the first storage.


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