The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 19, 2002
Filed:
Jun. 08, 2000
Shigeki Yagi, Chiba, JP;
Seiko Instruments Inc., , JP;
Abstract
A fluorescent X-ray analyzer has an X-ray generating device for generating X-rays, a shutter for shielding an X-ray flux generated from the X-ray generating device from radiating to a sample to be measured, and a shutter drive mechanism for opening and closing the shutter. An X-ray detecting device detects secondary X-rays generated when the X-ray flux is radiated to the sample to be measured. A measurement start order device orders the start of a measurement. An image input device optically reads and obtains image data corresponding to an external appearance and a background of the sample to be measured. A first storage circuit stores image data obtained by the image input device. A second storage circuit stores data related to a figure previously registered. A data comparing device compares the image data stored in the first storage circuit with the data stored in the second storage circuit. A state detecting device detects an installation state of the fluorescent X-ray analyzer.