The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 19, 2002

Filed:

Sep. 22, 1999
Applicant:
Inventors:

Yukio Ikezawa, Tokyo, JP;

Takeyuki Kato, Tokyo, JP;

Eiichi Yanagi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/00 ;
U.S. Cl.
CPC ...
G01B 9/00 ;
Abstract

A lens specifying apparatus comprising a light source ( ) for projecting a measuring light beam on a lens ( ) under examination, an area CCD ( ) image receiving element for receiving the measuring light beam transmitted by the lens ( ) under examination, a filter disc ( ) disposed, as means for providing spectral transmittances, at a midpoint of an optical path extending from the light source ( ) to the area CCD ( ), and a processing circuit ( ) for calculating the refractive characteristics and spectral transmittances of the lens ( ) under examination on the basis of an output of the area CCD ( ) and displaying the refractive characteristics and spectral transmittances on a monitor ( ).


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