The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 19, 2002

Filed:

Oct. 20, 1997
Applicant:
Inventors:

Tieer Gu, Troy, MI (US);

Willem den Boer, Troy, MI (US);

Assignee:

Guardian Industries Corp., Auburn Hills, MI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02F 1/1343 ;
U.S. Cl.
CPC ...
G02F 1/1343 ;
Abstract

This invention is related to an active matrix liquid crystal display (AMLCD) or an X-ray imaging device having a high aperture ratio, and method of making same. The imager or display has an increased aperture ratio because electrodes are formed over dual insulating layers so as to overlap portions of the array address lines and/or TFTs. Both the manufacturability and capacitive crosstalk of the device are improved due to the use of a photo-imageable organic insulating layer between the pixel electrodes and the address lines. An intermediate inorganic insulating layer is provided between the photo-imageable organic insulating layer and the overlapped TFTs in order to prevent the organic insulating layer from directly contacting semiconductor material in the TFTs thereby reducing potential voltage swings.


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