The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 19, 2002

Filed:

Sep. 20, 1999
Applicant:
Inventors:

Sei-seung Yoon, Seoul, KR;

Sang-pyo Hong, Seoul, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/128 ;
U.S. Cl.
CPC ...
G01R 3/128 ;
Abstract

Integrated circuits and methods use a margin test voltage generator that is powered at a first power supply voltage to generate a second power supply voltage that has a magnitude that is less than the magnitude of the first power supply voltage. During a low supply voltage margin test, a first logic circuit is powered at the first power supply voltage while a second logic circuit, which is the subject of the test, is powered at the second power supply voltage. As a result, the first power supply voltage may remain at a sufficient magnitude to reliably power other devices or components that are not undergoing the low supply voltage margin test.


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