The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 19, 2002

Filed:

Sep. 30, 1998
Applicant:
Inventors:

Jens Winslow, Edmonton, CA;

Rodney K. Ridley, Edmonton, CA;

Varagur S. V. Rajan, Sherwood Park, CA;

Yuwu Yu, Edmonton, CA;

Lawrence B. Staples, Edmonton, CA;

Assignee:

Hydroscope Cananda Inc., Edmonton, CA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 2/790 ; G01R 3/312 ;
U.S. Cl.
CPC ...
G01N 2/790 ; G01R 3/312 ;
Abstract

In accordance with the teachings of the present invention, a method is provided for analyzing RFT data from a data file. The method includes parsing the data file into pipe lengths, calculating a phase profile for the data points within each pipe length, locating potential defects in the pipe length using the phase profiles, determining for each defect a total equivalent phase shift as a combination of a circumferential equivalent phase shift and a non-circumferential equivalent phase shift, and using the total equivalent phase shift to analyze the defect.


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