The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 19, 2002
Filed:
Dec. 14, 1999
Donald Ray Gillis, San Jose, CA (US);
Reinhard Ferdinand Wolter, Saratoga, CA (US);
Kris Victor Schouterden, Los Gatos, CA (US);
International Business Machines Corp., Armonk, NY (US);
Abstract
A method and apparatus for providing predictive failure analysis using the resistance of a sensor such as a MR, GMR, spin valve or wear sensor. A baseline measurement of resistance for at least one sensor of a disk drive is obtained, subsequent measurements of resistance for the at least one sensor of a disk drive are periodically obtained and the subsequent measurements and the baseline measurement to identify a detrimental change to the at least one sensor are processed. The processing further includes comparing a subsequent resistance measurement for the at least one sensor to the baseline measurement of resistance for the at least one sensor to detect a head/disk interface problem and flagging the file for corrective action when the head/disk interface problem is detected. Alternatively, the processing further includes determining a change in stripe height based upon the difference between the baseline measurement of resistance and the subsequent measurement of resistance.