The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 19, 2002

Filed:

Sep. 20, 2000
Applicant:
Inventors:

Patrick John Krysan, Madison, WI (US);

Michael Richard Sussman, Madison, WI (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C12Q 1/68 ; C12P 1/934 ;
U.S. Cl.
CPC ...
C12Q 1/68 ; C12P 1/934 ;
Abstract

A method is described for the detection of a rare deletion mutant allele in a population of wild-type individuals. DNA samples from the individuals are subjected to a modified form of polymerase chain reaction (PCR) which favors the replication of truncated DNA strands over the synthesis of wild-type full length strands. The preferred way to bias the process toward the synthesis of truncated DNA strands is by limiting the extension step in the PCR reaction protocol. This process permits the convenient detection of a deletion mutant allele from a population of 1000 wild type individuals with the full length allele.


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