The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 19, 2002
Filed:
May. 14, 1999
Paul Bacchi, Novato, CA (US);
Paul S. Filipski, Greenbrae, CA (US);
Newport Corporation, Irvine, CA (US);
Abstract
Specimen edge-gripping prealigners ( ) grasp a wafer ( ) by at least three edge-gripping capstans ( ) that are equally spaced around a periphery ( ) of the wafer. Each edge-gripping capstan is coupled by a continuous synchronous belt ( ) to a drive hub ( ) that is rotated by a drive motor ( ). The belts are tensioned by idler pulleys ( ) that are rotated by a motive force ( ). The edge-gripping capstans and the drive drums are mounted to hinged bearing housings ( ) that are spring biased to urge the capstans away from the drive hub. Deactivating the motive force rotates the idler plates into a belt tensioning position that draws the capstans inward to grip the periphery of the wafer. Once gripped, rotation of the drive hub is coupled through the tensioned belts to the capstans. Driving all the capstans provides positive grasping and rotation of the wafer without surface contact with the wafer and thereby reduces wafer damage and particle contamination.