The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 12, 2002
Filed:
Jan. 05, 1999
Tuan M. Hoang, Westminster, CA (US);
Samuel Chu, West Hills, CA (US);
The Boeing Company, Chicago, IL (US);
Abstract
A system and method for detecting speed related defects in an electronic assembly includes application specific integrated circuits (ASICs) designed with registered I/O's to provide true at-speed testing of the electronic assembly. An interconnect test engine and a test access port controller control the generation of a progressive binary patterns. The test engine receives captured data from the other ASICs in response to the binary patterns. The method includes generating binary progressive scan patterns for the output registers of one ASIC that are scanned and captured at the input registers of another ASIC. The test results are stored in a multiple input shift register (MISR) where they can be accessed for examination and diagnostic evaluations.