The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 12, 2002
Filed:
Jan. 28, 2000
Method for automatically scaling sampled representations of single-valued and multi-valued waveforms
Stanley E. Jaffe, Santa Rosa, CA (US);
Agilent Technologies, Inc., Palo Alto, CA (US);
Abstract
A method automatically scales a sampled representation of a waveform applied to a sampling system, regardless of the nature of the waveform. The method, implemented within a digital oscilloscope or other type of sampling system, achieves amplitude auto-scaling from samples of the applied waveform acquired when the sampling system is un-triggered. The method then determines the nature of the applied waveform based on the number of acquired samples within an intermediate amplitude band and the number of amplitude transitions across the amplitude band. Records are then taken with the sampling system triggered and the occurrence of alternative designated events, based on the nature of the waveform, is detected within the records. Time offset and time gain are adjusted based on a first occurrence and a second occurrence of the designated event.