The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 12, 2002

Filed:

Jun. 16, 1995
Applicant:
Inventors:

Takeshi Kawazome, Yokohama, JP;

Yoshihiro Ishida, Kawasaki, JP;

Nobuyuki Shigeeda, Kawasaki, JP;

Toshiaki Minami, Atsugi, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/48 ;
U.S. Cl.
CPC ...
G06K 9/48 ;
Abstract

A contour-information extraction system which includes performing raster scanning of a document, detemining a position of an interpixel grid of image data in the document, detecting contour vectors for the interpixel grid in a main scanning direction, and detecting contour vectors for the interpixel grid in a sub-scanning direction. The contour vectors are detected based on a state of a group of pixels in a vicinity of the position of the interpixel grid. The system further includes determining a connection state of the detected contour vectors and extracting contour information for the interpixel grid based on the connection state of the contour vectors.


Find Patent Forward Citations

Kawazome, Takeshi. (2002). Contour-information extraction apparatus and method (U.S. Patent No. 6356656). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6356656

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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