The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 12, 2002
Filed:
Oct. 01, 1998
Applicant:
Inventors:
Assignee:
Oak Technology, Inc., Sunnyvale, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 7/16 ;
U.S. Cl.
CPC ...
H04N 7/16 ;
Abstract
Magnification/reduction is achieved by a single FIR filter under the control of a Digital Differential Analyzer (DDA) as would be used to simulate a perfectly straight line on a two-dimensional raster. The single FIR filter combines the processes of interpolation, filter, and decimation. The DDA is programmed with the desired magnification/reduction ratio and provides signals that control shifting of input samples into the FIR filter and selection of FIR coefficients for the FIR filter.