The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 12, 2002

Filed:

Feb. 25, 1999
Applicant:
Inventors:

Holger Schligtenhorst, Eindhoven, NL;

Godefridus A. M. Hurkx, Best, NL;

Andrew M. Warwick, Stockport, GB;

Assignee:

U.S. Philips Corporation, New York, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 2/970 ;
U.S. Cl.
CPC ...
H01L 2/970 ;
Abstract

In a semiconductor switch device such as an NPN transistor (T) or a power switching diode (D), a multiple-zone first region ( ) of one conductivity type forms a switchable p-n junction ( ) with a second region ( ) of opposite conductivity type. In accordance with the invention, this first region ( ) includes three distinct zones, namely a low-doped zone ( ), a high-doped zone ( ), and an intermediate additional zone ( ). The low-doped zone ( ) is provided by a semiconductor body portion ( ) having a substantially uniform p-type doping concentration (P−) and forms the p-n junction ( ) with the second region ( ). The distinct additional zone ( ) is present between the low-doped zone ( ) and the high-doped zone ( ). The high-doped zone ( ) which may form a contact zone has a doping concentration (P++) which is higher than that of the low-doped zone ( ) and which decreases towards the low-doped zone ( ). The distinct additional zone ( ) has an additional doping concentration (P+) which is lower than the doping concentration (P++) of the high-doped zone ( ) and which decreases towards the low-doped zone ( ). This triple-zone formation for the first region ( ) permits an improvement in switching behaviour, e.g. in terms of fall-time and energy dissipation during turn-off of the device (T, D). A very low doping (P−) can be used for low-doped zone ( ) so that, in the off-state of the device (T, D), this zone ( ) and also the additional zone ( ) can be fully depleted. The additional zone ( ) having its additional doping concentration provides a path for extracting residual charge carriers from the low-doped zone ( ) when the device (T, D) is being switched off.


Find Patent Forward Citations

Loading…