The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 12, 2002

Filed:

Jun. 14, 1999
Applicant:
Inventors:

Thomas K. Lo, Tucson, AZ (US);

Stephen M. Jensen, Tucson, AZ (US);

Assignee:

Raytheon Company, Lexington, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 2/700 ;
U.S. Cl.
CPC ...
H01L 2/700 ;
Abstract

A system and method of finding a detection threshold that separates real scene objects seen through an optical system from sensor fixed artifacts. The inventive system continuously scans the sensor so that objects in the scene move in an inverse sense relative to the scanning motion while fixed frame artifacts remain fixed in focal plane coordinate system. The difference in temporal behavior is used to discriminate against fixed frame artifacts. The inventive system finds a detection threshold that maximizes the portion of a target that may be segmented while avoiding setting the threshold so low that it merges spatially adjacent artifacts in with the target.


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