The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 12, 2002
Filed:
Mar. 14, 2000
Nobuaki Yamakawa, Shizuoka, JP;
Shigeji Kudo, Shizuoka, JP;
Yazaki Corporation, Tokyo, JP;
Abstract
A micrometer ( ) includes an anvil ( ) and a spindle ( ) having a flat plate-like distal end. The anvil ( ) includes a small-diameter pin ( C) of a predetermined length formed on a distal end portion of a rod-like anvil body ( A), and a detection portion ( ) of a tubular shape fitted on the anvil body ( A) to be slidably moved along the anvil body ( A), a distal end of the detection portion ( ) being formed into a plate-like shape, a pin insertion hole being formed in a central portion of the distal end of the detection portion ( ), and the pin being inserted in the pin insertion hole. The anvil ( ) further includes a dial gauge ( ) which is contacted at its distal end with the detection portion ( ), and indicates a plus value and a minus value in accordance with the movement of the detection portion ( ). The distal end of the anvil ( ) is abutted against the distal end of the spindle ( ), and when a distal end of the pin ( C) of the anvil ( ) coincides with the distal end of the detection portion ( ), the dial gauge ( ) is set to a zero point. An object ( ) to be measured is inserted between the anvil ( ) and the spindle ( ), and when the distal end of the anvil ( ) is brought into abutting engagement with the object to be measured, it is detected from the amount of movement of the detection portion ( ) relative to the pin of the anvil body ( A) whether the object to be measured is an appropriate one.