The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 05, 2002

Filed:

Dec. 23, 1998
Applicant:
Inventors:

Brian D. Koblenz, Seattle, WA (US);

Allan Porterfield, Bellevue, WA (US);

Burton J. Smith, Seattle, WA (US);

Assignee:

Cray Inc., Seattle, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/730 ;
U.S. Cl.
CPC ...
G06F 1/730 ;
Abstract

A method and system for allocating memory. The computer system on which the memory allocation system executes may support the simultaneous execution of multiple threads. Under control of a thread, the memory allocation system first identifies a bin associated with blocks (“lockers”) of memory large enough to satisfy a memory allocation request. When the identified bin has a free locker, the memory allocation system searches a circular list of headers associated with the identified bin for a collection of lockers (“warehouse”) that contains a locker that is available to be allocated. The memory allocation system allocates the found available locker to satisfy the request. If, however, the allocated bin has no free lockers, the memory allocation system allocates a warehouse with lockers large enough to satisfy the memory allocation request. The memory allocation system then adds a warehouse header for the allocated warehouse to a circular list of warehouse headers associated with the identified bin. The memory allocation system allocates a locker from the newly allocated warehouse to satisfy the memory allocation request.


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