The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 05, 2002
Filed:
Mar. 12, 1996
Vicki Ann Barbur, Berkhamsted, GB;
Andrew Green, Harrow, GB;
Eastman Kodak Company, Rochester, NY (US);
Abstract
Described herein is a method for reject analysis for use in any process where rejects occur. The method comprises using the application of multivariate statistical process control techniques, and allows the rejects from a process to be controlled in a simple and effective manner by deriving the T statistic for a series of variables or classification categories that impact reject performance characteristics. The calculated T value is compared with a standard value for the particular system. If the value exceeds the critical value , it suggests that there has been a significant change in the typical reject rate compared with the expected situation and therefore appropriate action can be taken to identify the cause of the change and procedures can be put in place to correct the problems, that is, to return the reject rate to the expected position.