The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 05, 2002
Filed:
Jun. 05, 2000
Martin Haardt, München, DE;
Christopher Brunner, München, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
A method for measuring characteristics of radio channels, in which the signals are received by a total of M receiving sensors in a linear antenna array, in which case the respective received signals are composed of wave elements of a transmitted signal with a different incidence direction and different delay, the transmitted signal contains a preselected test sequence, and the incidence angle as well as the delay of the dominant wave fronts are estimated simultaneously, taking account of the chip signal form of the test sequence, the signals from each antenna sensor are demodulated, and sampling is then carried out with M samples per chip in the test sequence. In this case, the resultant N ×M samples are transformed to the frequency domain by discrete Fourier transformation, and the values which are obtained from this are corrected taking account the spectrum of the chip signal form, in which case the line vectors formed from the values obtained for each sensor can be combined to form a data matrix X (n), which contains invariances which characterize the channel.