The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 05, 2002

Filed:

Jun. 19, 1998
Applicant:
Inventors:

Jieming Zhu, Fremont, CA (US);

Paul Ramsay, Fremont, CA (US);

Vince Guan, Placentia, CA (US);

Kha Sin Teow, San Jose, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 1/250 ; H04L 1/242 ;
U.S. Cl.
CPC ...
H04L 1/250 ; H04L 1/242 ;
Abstract

A probing device for resolving the limitations of fabric registration by providing a fabric with a system and method for concurrently probing multiple end-devices, which would otherwise be unusable to register with the fabric, to registration information. In addition, by relying upon the probing device, a fabric can avoid requiring any end-devices from having to initiate registration with the fabric.


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