The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 05, 2002
Filed:
Aug. 27, 1999
Curtis Egan, Thornton, CO (US);
Steve McCarthy, Platteville, CO (US);
David Winters, Fremont, CA (US);
Maxtor Corporation, Longmont, CO (US);
Abstract
A byte wide flaw scan interface is used to identify an characterize flaws in a disk medium. In one embodiment, the associated disk drive ( ) includes head electronics ( ) associated with a disk drive controller ( ) via an NRZ interface ( ). The NRZ interface ( ) is operative for transmitting flaw information for a particular disk address via 8 predefined bit lines. The bit lines have separate definitions for user data sector addresses and servo wedge addresses. By using this byte wide interface, media flaws of various types can be identified and characterized based on a single pass of the transducer head over the disk surface thereby shortening testing times.