The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 26, 2002
Filed:
Dec. 09, 1999
Chin-Chi Teng, Sunnyvale, CA (US);
Silicon Perspective Corporation, Santa Clara, CA (US);
Abstract
In an integrated circuit (IC) design, a set of K×N clocked IC devices (“syncs”) such as flip-flops and latches are organized into K clusters of N syncs each, with each cluster being clocked by a separate clock tree buffer. An improvement to a conventional “K-center” method for assigning syncs to clusters is disclosed. The improved method, which reduces the separation between syncs within the clusters, initially employs the conventional K-center method to preliminarily assign the K×N syncs to K clusters having N syncs per cluster. The improved method thereafter ascertains boundaries of rectangular areas of the IC occupied by the separate clusters. When areas of any group of M>1 clusters overlap, the K-center meth is repeated to reassign the set of M×N syncs included in e M overlapping clusters to a new set of M clusters. The new set of M clusters are less likely to overlap.