The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 26, 2002

Filed:

Jan. 10, 2001
Applicant:
Inventors:

Steven R. Klassen, Austin, TX (US);

Atish Ghosh, Austin, TX (US);

Hans L. Magnusson, Buda, TX (US);

Assignee:

Advanced Micro Devices, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/130 ;
U.S. Cl.
CPC ...
G06F 1/130 ;
Abstract

An apparatus and method are presented for monitoring the performance of a microprocessor. The apparatus includes performance monitoring hardware incorporated within the microprocessor. The performance monitoring hardware includes a memory unit for storing performance data. The memory unit includes multiple memory locations, each memory location being accessed by a unique set of address signals. Circuitry within the performance monitoring hardware produces the address signals. In one embodiment, the performance monitoring hardware includes an event select register array and circuitry for producing a set of high order (i.e., most significant) address signals. The event select register array preferably includes several event select registers for storing binary codes corresponding to selected events. A performance data acquisition period is divided into multiple histogram time periods of equal length. The high order address signals partition the memory unit into sections. Each section is associated with a given histogram time period.


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